Path:OKDatasheet > Semiconductor Datasheet > TI Datasheet > SN74BCT8373ADW
SN74BCT8373ADW specification: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
Path:OKDatasheet > Semiconductor Datasheet > TI Datasheet > SN74BCT8373ADW
SN74BCT8373ADW specification: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
Tillverkare : TI
Packing : DW
Pins : 24
Temperature : Min 0 °C | Max 70 °C
Storlek : 323 KB
Ansökan : IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES