Path:OKDatasheet > Semiconductor Datasheet > TI Datasheet > SNJ54BCT8373AFK
SNJ54BCT8373AFK specification: SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SNJ54BCT8373AFK Liknande
- SNJ5400J
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5400W
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5400WA
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5401J
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
- SNJ5401W
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
- SNJ5402J
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
- SNJ5402J
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
- SNJ5402W
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
SNJ54BCT8373AFK Datasheet och Spec
Tillverkare : TI
Packing : FK
Pins : 28
Temperature : Min -55 °C | Max 125 °C
Storlek : 323 KB
Ansökan : SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
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